YX-2D6

YX-2D6A X-Ray Crystal Orientation Apparatus is a common type product designed for multiple crystals (such as single crystal silicon, gallium arsenide and sapphire). Based on standard orientation instrument, YX-2D6A is mainly used for measurement of crystal wafer and ingot with outboard displayer and additional bearing rail on sample table.

Standard Configuration: GA, GB Goniometer

• GA goniometer can measure angle of crystal wafer of 2-6 inches in diameter, such as silicon (111, 110) or sapphire Planes A, C and R.
• GB goniometer is especially designed for crystal ingot. With level supporting board of 130mm in width and 300mm in length and two mobile nylon V-shape ingot support bars, it can measure 2 to 6 inch crystal wafer, and planes of crystal ingot of 2-6 inches in diameter and 400mm in length, for example, silicon (111) or sapphire Plane C.

Technical Specifications 

Clients may select different models of 2-side goniometers, such as GC, GD, GE, GF and GH, according to crystal dimensions and shape.

YX-2D6C X-Ray Crystal Orientation Apparatus (GA+GD; suitable for crystal wafer and wafer reference plane)

Standard Configuration: GA, GD Goniometer 

• GA goniometer on one side can measure angle of crystal wafer of 2-6 inches in diameter, such as silicon (111, 110) or sapphire Planes A, C and R.
• GD goniometer on the other side can measure reference plane or OF plane of 2 to 6 inch crystal wafer, such as silicon (110) or sapphire Plane A.

Technical Specifications