YX-2H8
YX-2H8 X-Ray Crystal Orientation Apparatus is a product especially designed for multiple crystals (such as single crystal silicon, gallium arsenide and sapphire) on the basis of standard orientation instrument. It is mainly used for measurement of crystal wafer and ingot with outboard displayer and additional bearing rail on sample table.
Standard Configuration: GA, GC Goniometer
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GA goniometer on one side can measure angle of crystal wafer of 2-8 inches in diameter, such as silicon (111, 110) or sapphire Plane A.
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GC goniometer on the other side can measure angle of planes of crystal ingot at 5-8 inches in diameter and 500mm in length by changing width of the rolling bars, for example, silicon (111, 110) or sapphire Plane C.
Technical Specifications
| Item | Parameter |
| Crystal Wafer Diameter | 2-8 inch; max. 11 inch |
| Crystal Ingot Diameter | 5-8 inch; max. 11 inch |
| Crystal Ingot Length | 500mm; max. 550mm |
| Sample Plate Area | 43 (W) ×112 (H) mm |
| Orientation Precision | ±30″ |
| Display Method | q: degree, minute, second |
| Min. Reading | 10″ |
| Displayer | Outer vertical type |
Clients may select different models of 2-side goniometers, such as GB, GD, GE, GF and GH, according to crystal dimensions and shape.
